BibTeX record conf/vts/ChaCLM14

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@inproceedings{DBLP:conf/vts/ChaCLM14,
  author       = {Soonyoung Cha and
                  Chang{-}Chih Chen and
                  Taizhi Liu and
                  Linda S. Milor},
  title        = {Extraction of threshold voltage degradation modeling due to Negative
                  Bias Temperature Instability in circuits with {I/O} measurements},
  booktitle    = {32nd {IEEE} {VLSI} Test Symposium, {VTS} 2014, Napa, CA, USA, April
                  13-17, 2014},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2014},
  url          = {https://doi.org/10.1109/VTS.2014.6818769},
  doi          = {10.1109/VTS.2014.6818769},
  timestamp    = {Fri, 24 Mar 2023 00:04:05 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/ChaCLM14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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