BibTeX record conf/vts/BarnettSN01

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@inproceedings{DBLP:conf/vts/BarnettSN01,
  author       = {Thomas S. Barnett and
                  Adit D. Singh and
                  Victor P. Nelson},
  title        = {Burn-In Failures and Local Region Yield: An Integrated Yield-Reliability
                  Model},
  booktitle    = {19th {IEEE} {VLSI} Test Symposium {(VTS} 2001), Test and Diagnosis
                  in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA,
                  {USA}},
  pages        = {326--332},
  publisher    = {{IEEE} Computer Society},
  year         = {2001},
  url          = {https://doi.org/10.1109/VTS.2001.923457},
  doi          = {10.1109/VTS.2001.923457},
  timestamp    = {Fri, 24 Mar 2023 00:04:05 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/BarnettSN01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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