BibTeX record conf/vts/Al-ArsHG07

download as .bib file

@inproceedings{DBLP:conf/vts/Al-ArsHG07,
  author       = {Zaid Al{-}Ars and
                  Said Hamdioui and
                  Georgi Gaydadjiev},
  title        = {Optimizing Test Length for Soft Faults in {DRAM} Devices},
  booktitle    = {25th {IEEE} {VLSI} Test Symposium {(VTS} 2007), 6-10 May 2007, Berkeley,
                  California, {USA}},
  pages        = {59--66},
  publisher    = {{IEEE} Computer Society},
  year         = {2007},
  url          = {https://doi.org/10.1109/VTS.2007.46},
  doi          = {10.1109/VTS.2007.46},
  timestamp    = {Fri, 24 Mar 2023 00:04:04 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/Al-ArsHG07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.