BibTeX record conf/vlsid/ZhangA15

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@inproceedings{DBLP:conf/vlsid/ZhangA15,
  author    = {Bei Zhang and
               Vishwani D. Agrawal},
  title     = {Diagnostic Tests for Pre-bond {TSV} Defects},
  booktitle = {28th International Conference on {VLSI} Design, {VLSID} 2015, Bangalore,
               India, January 3-7, 2015},
  pages     = {387--392},
  year      = {2015},
  crossref  = {DBLP:conf/vlsid/2015},
  url       = {https://doi.org/10.1109/VLSID.2015.71},
  doi       = {10.1109/VLSID.2015.71},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vlsid/ZhangA15},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/vlsid/2015,
  title     = {28th International Conference on {VLSI} Design, {VLSID} 2015, Bangalore,
               India, January 3-7, 2015},
  publisher = {{IEEE} Computer Society},
  year      = {2015},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/7031475/proceeding},
  isbn      = {978-1-4799-6658-5},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vlsid/2015},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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