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BibTeX record conf/vlsid/ShanmugasundaramA12
@inproceedings{DBLP:conf/vlsid/ShanmugasundaramA12, author = {Priyadharshini Shanmugasundaram and Vishwani D. Agrawal}, editor = {Vishwani D. Agrawal and Srimat T. Chakradhar}, title = {Externally Tested Scan Circuit with Built-In Activity Monitor and Adaptive Test Clock}, booktitle = {25th International Conference on {VLSI} Design, Hyderabad, India, January 7-11, 2012}, pages = {448--453}, publisher = {{IEEE} Computer Society}, year = {2012}, url = {https://doi.org/10.1109/VLSID.2012.112}, doi = {10.1109/VLSID.2012.112}, timestamp = {Fri, 24 Mar 2023 00:03:59 +0100}, biburl = {https://dblp.org/rec/conf/vlsid/ShanmugasundaramA12.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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