BibTeX record conf/vlsid/JoneHD97

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@inproceedings{DBLP:conf/vlsid/JoneHD97,
  author       = {Wen{-}Ben Jone and
                  Yun{-}Pan Ho and
                  Sunil R. Das},
  title        = {Delay Fault Coverage Enhancement Using Multiple Test Observation Times},
  booktitle    = {10th International Conference on {VLSI} Design {(VLSI} Design 1997),
                  4-7 January 1997, Hyderabad, India},
  pages        = {106--110},
  publisher    = {{IEEE} Computer Society},
  year         = {1997},
  url          = {https://doi.org/10.1109/ICVD.1997.567970},
  doi          = {10.1109/ICVD.1997.567970},
  timestamp    = {Fri, 24 Mar 2023 00:04:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vlsid/JoneHD97.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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