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BibTeX record conf/vlsid/JoneHD97
@inproceedings{DBLP:conf/vlsid/JoneHD97, author = {Wen{-}Ben Jone and Yun{-}Pan Ho and Sunil R. Das}, title = {Delay Fault Coverage Enhancement Using Multiple Test Observation Times}, booktitle = {10th International Conference on {VLSI} Design {(VLSI} Design 1997), 4-7 January 1997, Hyderabad, India}, pages = {106--110}, publisher = {{IEEE} Computer Society}, year = {1997}, url = {https://doi.org/10.1109/ICVD.1997.567970}, doi = {10.1109/ICVD.1997.567970}, timestamp = {Fri, 24 Mar 2023 00:04:00 +0100}, biburl = {https://dblp.org/rec/conf/vlsid/JoneHD97.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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