BibTeX record conf/vlsid/GuptaBP15

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@inproceedings{DBLP:conf/vlsid/GuptaBP15,
  author       = {Radhika Gupta and
                  Atul Bhargava and
                  Rakeshshenoy Panemangalore},
  title        = {Block-Level Electro-Migration Analysis {(BEMA)} for Safer Product
                  Life},
  booktitle    = {28th International Conference on {VLSI} Design, {VLSID} 2015, Bangalore,
                  India, January 3-7, 2015},
  pages        = {276--281},
  publisher    = {{IEEE} Computer Society},
  year         = {2015},
  url          = {https://doi.org/10.1109/VLSID.2015.53},
  doi          = {10.1109/VLSID.2015.53},
  timestamp    = {Sat, 30 Sep 2023 09:58:22 +0200},
  biburl       = {https://dblp.org/rec/conf/vlsid/GuptaBP15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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