BibTeX record conf/vlsid/BanerjeeCR96

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@inproceedings{DBLP:conf/vlsid/BanerjeeCR96,
  author       = {Savita Banerjee and
                  Srimat T. Chakradhar and
                  Rabindra K. Roy},
  title        = {Synchronous Test Generation Model for Asynchronous Circuits},
  booktitle    = {9th International Conference on {VLSI} Design {(VLSI} Design 1996),
                  3-6 January 1996, Bangalore, India},
  pages        = {178--185},
  publisher    = {{IEEE} Computer Society},
  year         = {1996},
  url          = {https://doi.org/10.1109/ICVD.1996.489481},
  doi          = {10.1109/ICVD.1996.489481},
  timestamp    = {Fri, 24 Mar 2023 00:04:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vlsid/BanerjeeCR96.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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