BibTeX record conf/vlsi-dat/LinderCKW13

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@inproceedings{DBLP:conf/vlsi-dat/LinderCKW13,
  author       = {Barry P. Linder and
                  Eduard Cartier and
                  S. Krishnan and
                  Ernest Y. Wu},
  title        = {Improving and optimizing reliability in future technologies with high-{\(\kappa\)}
                  dielectrics},
  booktitle    = {2013 International Symposium on {VLSI} Design, Automation, and Test,
                  {VLSI-DAT} 2013, Hsinchu, Taiwan, April 22-24, 2013},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2013},
  url          = {https://doi.org/10.1109/VLDI-DAT.2013.6533828},
  doi          = {10.1109/VLDI-DAT.2013.6533828},
  timestamp    = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl       = {https://dblp.org/rec/conf/vlsi-dat/LinderCKW13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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