BibTeX record conf/seke/JingZL17

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@inproceedings{DBLP:conf/seke/JingZL17,
  author       = {Yiyang Jing and
                  Jiansheng Zhang and
                  Jin Liu},
  editor       = {Xudong He},
  title        = {Is the Number of Faults Helpful for Cross-Company Defect Prediction?},
  booktitle    = {The 29th International Conference on Software Engineering and Knowledge
                  Engineering, Wyndham Pittsburgh University Center, Pittsburgh, PA,
                  USA, July 5-7, 2017},
  pages        = {111--116},
  publisher    = {{KSI} Research Inc. and Knowledge Systems Institute Graduate School},
  year         = {2017},
  url          = {https://doi.org/10.18293/SEKE2017-034},
  doi          = {10.18293/SEKE2017-034},
  timestamp    = {Wed, 03 Feb 2021 08:31:33 +0100},
  biburl       = {https://dblp.org/rec/conf/seke/JingZL17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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