BibTeX record conf/sam/ZeissNGEB06

• > Home > conf/sam/ZeissNGEB06

@inproceedings{DBLP:conf/sam/ZeissNGEB06,
  author       = {Benjamin Zeiss and
                  Helmut Neukirchen and
                  Jens Grabowski and
                  Dominic Evans and
                  Paul Baker},
  editor       = {Reinhard Gotzhein and
                  Rick Reed},
  title        = {Refactoring and Metrics for {TTCN-3} Test Suites},
  booktitle    = {System Analysis and Modeling: Language Profiles, 5th International
                  Workshop, {SAM} 2006, Kaiserslautern, Germany, May 31 - June 2, 2006,
                  Revised Selected Papers},
  series       = {Lecture Notes in Computer Science},
  volume       = {4320},
  pages        = {148--165},
  publisher    = {Springer},
  year         = {2006},
  url          = {https://doi.org/10.1007/11951148\_10},
  doi          = {10.1007/11951148\_10},
  timestamp    = {Tue, 12 Nov 2019 11:03:53 +0100},
  biburl       = {https://dblp.org/rec/conf/sam/ZeissNGEB06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}