BibTeX record conf/re/WassonSLK05

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@inproceedings{DBLP:conf/re/WassonSLK05,
  author       = {Kimberly S. Wasson and
                  Kendra N. Schmid and
                  Robyn R. Lutz and
                  John C. Knight},
  title        = {Using Occurrence Properties of Defect Report Data to Improve Requirements},
  booktitle    = {13th {IEEE} International Conference on Requirements Engineering {(RE}
                  2005), 29 August - 2 September 2005, Paris, France},
  pages        = {253--262},
  publisher    = {{IEEE} Computer Society},
  year         = {2005},
  url          = {https://doi.org/10.1109/RE.2005.77},
  doi          = {10.1109/RE.2005.77},
  timestamp    = {Fri, 24 Mar 2023 00:05:04 +0100},
  biburl       = {https://dblp.org/rec/conf/re/WassonSLK05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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