BibTeX record conf/qrs/ZhouDLSHY17

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@inproceedings{DBLP:conf/qrs/ZhouDLSHY17,
  author       = {Ge Zhou and
                  Wei Dong and
                  Wanwei Liu and
                  Hao Shi and
                  Chi Hu and
                  Liangze Yin},
  title        = {Optimizing Monitor Code Based on Patterns in Runtime Verification},
  booktitle    = {2017 {IEEE} International Conference on Software Quality, Reliability
                  and Security Companion, {QRS-C} 2017, Prague, Czech Republic, July
                  25-29, 2017},
  pages        = {348--354},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/QRS-C.2017.65},
  doi          = {10.1109/QRS-C.2017.65},
  timestamp    = {Wed, 16 Oct 2019 14:14:57 +0200},
  biburl       = {https://dblp.org/rec/conf/qrs/ZhouDLSHY17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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