BibTeX record conf/norchip/StrickerKKBMP18

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@inproceedings{DBLP:conf/norchip/StrickerKKBMP18,
  author       = {Jonas Stricker and
                  Clemens Kain and
                  J{\'{e}}r{\^{o}}me Kirscher and
                  Andi Buzo and
                  Linus Maurer and
                  Georg Pelz},
  editor       = {Jari Nurmi and
                  Peeter Ellervee and
                  Juri Mihhailov and
                  Maksim Jenihhin and
                  Kalle Tammem{\"{a}}e},
  title        = {Semiconductor Component Fault Assessment and Probability Impact Estimation
                  on Application Level},
  booktitle    = {2018 {IEEE} Nordic Circuits and Systems Conference, {NORCAS} 2018:
                  {NORCHIP} and International Symposium of System-on-Chip (SoC), Tallinn,
                  Estonia, October 30-31, 2018},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/NORCHIP.2018.8573501},
  doi          = {10.1109/NORCHIP.2018.8573501},
  timestamp    = {Wed, 16 Oct 2019 14:14:56 +0200},
  biburl       = {https://dblp.org/rec/conf/norchip/StrickerKKBMP18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}