BibTeX record conf/nanoarch/0002CF12

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@inproceedings{DBLP:conf/nanoarch/0002CF12,
  author       = {Yao Wang and
                  Sorin Dan Cotofana and
                  Liang Fang},
  editor       = {Csaba Andras Moritz},
  title        = {Statistical reliability analysis of {NBTI} impact on FinFET SRAMs
                  and mitigation technique using independent-gate devices},
  booktitle    = {Proceedings of the 2012 {IEEE/ACM} International Symposium on Nanoscale
                  Architectures, {NANOARCH} 2012, Amsterdam, The Netherlands, July 4-6,
                  2012},
  pages        = {109--115},
  publisher    = {{ACM}},
  year         = {2012},
  url          = {https://doi.org/10.1145/2765491.2765512},
  doi          = {10.1145/2765491.2765512},
  timestamp    = {Wed, 11 Aug 2021 17:02:31 +0200},
  biburl       = {https://dblp.org/rec/conf/nanoarch/0002CF12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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