BibTeX record conf/mtdt/Al-ArsG03

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@inproceedings{DBLP:conf/mtdt/Al-ArsG03,
  author       = {Zaid Al{-}Ars and
                  Ad J. van de Goor},
  title        = {Systematic Memory Test Generation for {DRAM} Defects Causing Two Floating
                  Nodes},
  booktitle    = {11th {IEEE} International Workshop on Memory Technology, Design, and
                  Testing {(MTDT} 2003), 28-29 July 2003, San Jose, CA, {USA}},
  pages        = {27--32},
  publisher    = {{IEEE} Computer Society},
  year         = {2003},
  url          = {https://doi.org/10.1109/MTDT.2003.1222357},
  doi          = {10.1109/MTDT.2003.1222357},
  timestamp    = {Fri, 24 Mar 2023 00:03:36 +0100},
  biburl       = {https://dblp.org/rec/conf/mtdt/Al-ArsG03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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