BibTeX record conf/latw/LiZA15

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@inproceedings{DBLP:conf/latw/LiZA15,
  author    = {Baohu Li and
               Bei Zhang and
               Vishwani D. Agrawal},
  title     = {Adopting multi-valued logic for reduced pin-count testing},
  booktitle = {16th Latin-American Test Symposium, {LATS} 2015, Puerto Vallarta,
               Mexico, March 25-27, 2015},
  pages     = {1--6},
  year      = {2015},
  crossref  = {DBLP:conf/latw/2015},
  url       = {https://doi.org/10.1109/LATW.2015.7102497},
  doi       = {10.1109/LATW.2015.7102497},
  timestamp = {Fri, 19 May 2017 01:26:30 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/latw/LiZA15},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/latw/2015,
  title     = {16th Latin-American Test Symposium, {LATS} 2015, Puerto Vallarta,
               Mexico, March 25-27, 2015},
  publisher = {{IEEE} Computer Society},
  year      = {2015},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=7101754},
  isbn      = {978-1-4673-6710-3},
  timestamp = {Wed, 26 Aug 2015 15:50:35 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/latw/2015},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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