BibTeX record conf/latw/KarelACGR18

• > Home > conf/latw/KarelACGR18

@inproceedings{DBLP:conf/latw/KarelACGR18,
  author       = {Amit Karel and
                  Florence Aza{\"{\i}}s and
                  Mariane Comte and
                  Jean{-}Marc Galli{\`{e}}re and
                  Michel Renovell},
  title        = {Impact of process variations on the detectability of resistive short
                  defects: Comparative analysis between 28nm Bulk and {FDSOI} technologies},
  booktitle    = {19th {IEEE} Latin-American Test Symposium, {LATS} 2018, Sao Paulo,
                  Brazil, March 12-14, 2018},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/LATW.2018.8349696},
  doi          = {10.1109/LATW.2018.8349696},
  timestamp    = {Fri, 19 Apr 2024 12:17:36 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/KarelACGR18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}