BibTeX record conf/kes/BishHH00

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@inproceedings{DBLP:conf/kes/BishHH00,
  author       = {N. B. Bish and
                  Peter A. Howson and
                  Robert J. Howlett},
  editor       = {Robert J. Howlett and
                  Lakhmi C. Jain},
  title        = {Condition diagnostics of a physical breakdown mechanism in high voltage
                  dielectrics utilising 'AI' evaluation techniques},
  booktitle    = {Fourth International Conference on Knowledge-Based Intelligent Information
                  Engineering Systems {\&} Allied Technologies, {KES} 2000, Brighton,
                  UK, 30 August - 1 September 2000, Proceedings, 2 Volumes},
  pages        = {644--650},
  publisher    = {{IEEE}},
  year         = {2000},
  url          = {https://doi.org/10.1109/KES.2000.884129},
  doi          = {10.1109/KES.2000.884129},
  timestamp    = {Sun, 21 May 2017 00:17:56 +0200},
  biburl       = {https://dblp.org/rec/conf/kes/BishHH00.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}