BibTeX record conf/iwsoc/HuhBMCNJV05

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@inproceedings{DBLP:conf/iwsoc/HuhBMCNJV05,
  author       = {Yoon Huh and
                  Peter Bendix and
                  Kyungjin Min and
                  Jau{-}Wen Chen and
                  Ravindra Narayan and
                  Larry D. Johnson and
                  Steven H. Voldman},
  title        = {ESD-Induced Internal Core Device Failure: New Failure Modes in System-on-Chip
                  (SoC) Designs, invited},
  booktitle    = {Proceedings of the 5th {IEEE} International Workshop on System-on-Chip
                  for Real-Time Applications {(IWSOC} 2005), 20-24 July 2004, Banff,
                  Alberta, Canada},
  pages        = {47--53},
  publisher    = {{IEEE} Computer Society},
  year         = {2005},
  url          = {https://doi.org/10.1109/IWSOC.2005.58},
  doi          = {10.1109/IWSOC.2005.58},
  timestamp    = {Thu, 23 Mar 2023 23:58:37 +0100},
  biburl       = {https://dblp.org/rec/conf/iwsoc/HuhBMCNJV05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}