BibTeX record conf/itc/ShaoGRP99

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@inproceedings{DBLP:conf/itc/ShaoGRP99,
  author       = {Yun Shao and
                  Ruifeng Guo and
                  Sudhakar M. Reddy and
                  Irith Pomeranz},
  title        = {The effects of test compaction on fault diagnosis},
  booktitle    = {Proceedings {IEEE} International Test Conference 1999, Atlantic City,
                  NJ, USA, 27-30 September 1999},
  pages        = {1083--1089},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/TEST.1999.805842},
  doi          = {10.1109/TEST.1999.805842},
  timestamp    = {Thu, 23 Mar 2023 23:58:40 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/ShaoGRP99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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