BibTeX record conf/itc/SatoKYHIMUHSS12

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@inproceedings{DBLP:conf/itc/SatoKYHIMUHSS12,
  author       = {Yasuo Sato and
                  Seiji Kajihara and
                  Tomokazu Yoneda and
                  Kazumi Hatayama and
                  Michiko Inoue and
                  Yukiya Miura and
                  Satosni Untake and
                  Takumi Hasegawa and
                  Motoyuki Sato and
                  Kotaro Shimamura},
  title        = {{DART:} Dependable {VLSI} test architecture and its implementation},
  booktitle    = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
                  USA, November 5-8, 2012},
  pages        = {1--10},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/TEST.2012.6401581},
  doi          = {10.1109/TEST.2012.6401581},
  timestamp    = {Thu, 23 Mar 2023 23:58:42 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/SatoKYHIMUHSS12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}