BibTeX record conf/itc/RijsingeHVW90

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@inproceedings{DBLP:conf/itc/RijsingeHVW90,
  author       = {Robert Van Rijsinge and
                  A. A. R. M. Haggenburg and
                  C. de Vries and
                  Hans Wallinga},
  title        = {From specification to measurement: the bottleneck in analog industrial
                  testing},
  booktitle    = {Proceedings {IEEE} International Test Conference 1990, Washington,
                  D.C., USA, September 10-14, 1990},
  pages        = {177--182},
  publisher    = {{IEEE} Computer Society},
  year         = {1990},
  url          = {https://doi.org/10.1109/TEST.1990.114016},
  doi          = {10.1109/TEST.1990.114016},
  timestamp    = {Thu, 23 Mar 2023 23:58:37 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/RijsingeHVW90.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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