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BibTeX record conf/itc/OdintsovJD17
@inproceedings{DBLP:conf/itc/OdintsovJD17, author = {Sergei Odintsov and Artur Jutman and Sergei Devadze}, title = {Marginal {PCB} assembly defect detection on {DDR3/4} memory bus}, booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX, USA, October 31 - Nov. 2, 2017}, pages = {1--10}, publisher = {{IEEE}}, year = {2017}, url = {https://doi.org/10.1109/TEST.2017.8242070}, doi = {10.1109/TEST.2017.8242070}, timestamp = {Thu, 14 Oct 2021 09:45:51 +0200}, biburl = {https://dblp.org/rec/conf/itc/OdintsovJD17.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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