BibTeX record conf/itc/NighG04

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@inproceedings{DBLP:conf/itc/NighG04,
  author       = {Phil Nigh and
                  Anne E. Gattiker},
  title        = {Random and Systematic Defect Analysis Using {IDDQ} Signature Analysis
                  for Understanding Fails and Guiding Test Decisions},
  booktitle    = {Proceedings 2004 International Test Conference {(ITC} 2004), October
                  26-28, 2004, Charlotte, NC, {USA}},
  pages        = {309--318},
  publisher    = {{IEEE} Computer Society},
  year         = {2004},
  url          = {https://doi.org/10.1109/TEST.2004.1386966},
  doi          = {10.1109/TEST.2004.1386966},
  timestamp    = {Thu, 23 Mar 2023 23:58:41 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/NighG04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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