BibTeX record conf/itc/MittalLNB16

download as .bib file

@inproceedings{DBLP:conf/itc/MittalLNB16,
  author       = {Soumya Mittal and
                  Zeye Liu and
                  Ben Niewenhuis and
                  R. D. (Shawn) Blanton},
  title        = {Test chip design for optimal cell-aware diagnosability},
  booktitle    = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
                  TX, USA, November 15-17, 2016},
  pages        = {1--8},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/TEST.2016.7805850},
  doi          = {10.1109/TEST.2016.7805850},
  timestamp    = {Fri, 27 Mar 2020 08:45:56 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/MittalLNB16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.