BibTeX record conf/itc/MaugardWOK03

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@inproceedings{DBLP:conf/itc/MaugardWOK03,
  author       = {Gwenol{\'{e}} Maugard and
                  Carsten Wegener and
                  Tom O'Dwyer and
                  Michael Peter Kennedy},
  title        = {Method of reducing contactor effect when testing high-precision ADCs},
  booktitle    = {Proceedings 2003 International Test Conference {(ITC} 2003), Breaking
                  Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte,
                  NC, {USA}},
  pages        = {210--217},
  publisher    = {{IEEE} Computer Society},
  year         = {2003},
  url          = {https://doi.org/10.1109/TEST.2003.1270842},
  doi          = {10.1109/TEST.2003.1270842},
  timestamp    = {Thu, 23 Mar 2023 23:58:42 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/MaugardWOK03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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