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BibTeX record conf/itc/LindenKG94
@inproceedings{DBLP:conf/itc/LindenKG94, author = {J. Th. van der Linden and M. H. Konijnenburg and Ad J. van de Goor}, title = {Parallel Pattern Fast Fault Simulation for Three-State Circuits and Bidirectional {I/O}}, booktitle = {Proceedings {IEEE} International Test Conference 1994, {TEST:} The Next 25 Years, Washington, DC, USA, October 2-6, 1994}, pages = {604--613}, publisher = {{IEEE} Computer Society}, year = {1994}, url = {https://doi.org/10.1109/TEST.1994.528005}, doi = {10.1109/TEST.1994.528005}, timestamp = {Thu, 23 Mar 2023 23:58:38 +0100}, biburl = {https://dblp.org/rec/conf/itc/LindenKG94.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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