BibTeX record conf/itc/LinAYP18

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@inproceedings{DBLP:conf/itc/LinAYP18,
  author    = {Yibo Lin and
               Mohamed Baker Alawieh and
               Wei Ye and
               David Z. Pan},
  title     = {Machine Learning for Yield Learning and Optimization},
  booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
               October 29 - Nov. 1, 2018},
  pages     = {1--10},
  year      = {2018},
  crossref  = {DBLP:conf/itc/2018},
  url       = {https://doi.org/10.1109/TEST.2018.8624733},
  doi       = {10.1109/TEST.2018.8624733},
  timestamp = {Sat, 19 Oct 2019 19:58:34 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/LinAYP18},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/2018,
  title     = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
               October 29 - Nov. 1, 2018},
  publisher = {{IEEE}},
  year      = {2018},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/8610502/proceeding},
  isbn      = {978-1-5386-8382-8},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/2018},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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