BibTeX record conf/itc/KrusemanTHDHBX11

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@inproceedings{DBLP:conf/itc/KrusemanTHDHBX11,
  author       = {Bram Kruseman and
                  Bratislav Tasic and
                  Camelia Hora and
                  Jos Dohmen and
                  Hamidreza Hashempour and
                  Maikel van Beurden and
                  Yizi Xing},
  editor       = {Bill Eklow and
                  R. D. (Shawn) Blanton},
  title        = {Defect Oriented Testing for analog/mixed-signal devices},
  booktitle    = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
                  USA, September 20-22, 2011},
  pages        = {1--10},
  publisher    = {{IEEE} Computer Society},
  year         = {2011},
  url          = {https://doi.org/10.1109/TEST.2011.6139127},
  doi          = {10.1109/TEST.2011.6139127},
  timestamp    = {Thu, 23 Mar 2023 23:58:37 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/KrusemanTHDHBX11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}