BibTeX record conf/itc/KonijnenburgLG96

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@inproceedings{DBLP:conf/itc/KonijnenburgLG96,
  author    = {M. H. Konijnenburg and
               J. Th. van der Linden and
               A. J. van de Goor},
  title     = {Accelerated Compact Test Set Generation for Three-State Circuits},
  booktitle = {Proceedings {IEEE} International Test Conference 1996, Test and Design
               Validity, Washington, DC, USA, October 20-25, 1996},
  pages     = {29--38},
  publisher = {{IEEE} Computer Society},
  year      = {1996},
  url       = {https://doi.org/10.1109/TEST.1996.556940},
  doi       = {10.1109/TEST.1996.556940},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/conf/itc/KonijnenburgLG96.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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