BibTeX record conf/itc/JongBGW01

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@inproceedings{DBLP:conf/itc/JongBGW01,
  author       = {Frans G. M. de Jong and
                  Alex S. Biewenga and
                  D. C. L. (Erik) van Geest and
                  T. F. Waayers},
  title        = {Testing and programming flash memories on assemblies during high volume
                  production},
  booktitle    = {Proceedings {IEEE} International Test Conference 2001, Baltimore,
                  MD, USA, 30 October - 1 November 2001},
  pages        = {470--479},
  publisher    = {{IEEE} Computer Society},
  year         = {2001},
  url          = {https://doi.org/10.1109/TEST.2001.966664},
  doi          = {10.1109/TEST.2001.966664},
  timestamp    = {Thu, 23 Mar 2023 23:58:41 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/JongBGW01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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