BibTeX record conf/itc/HsuCHLLLPW13

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@inproceedings{DBLP:conf/itc/HsuCHLLLPW13,
  author       = {Sen{-}Kuei Hsu and
                  Hao Chen and
                  Chung{-}Han Huang and
                  Der{-}Jiann Liu and
                  Wei{-}Hsun Lin and
                  Hung{-}Chih Lin and
                  Ching{-}Nen Peng and
                  Min{-}Jer Wang},
  title        = {Test-yield improvement of high-density probing technology using optimized
                  metal backer with plastic patch},
  booktitle    = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
                  USA, September 6-13, 2013},
  pages        = {1--10},
  publisher    = {{IEEE} Computer Society},
  year         = {2013},
  url          = {https://doi.org/10.1109/TEST.2013.6651888},
  doi          = {10.1109/TEST.2013.6651888},
  timestamp    = {Thu, 23 Mar 2023 23:58:41 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/HsuCHLLLPW13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}