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BibTeX record conf/itc/HowellHBVDGRSFR18
@inproceedings{DBLP:conf/itc/HowellHBVDGRSFR18, author = {Will Howell and Friedrich Hapke and Edward Brazil and Srikanth Venkataraman and R. Datta and Andreas Glowatz and Wilfried Redemund and J. Schmerberg and Anja Fast and Janusz Rajski}, title = {{DPPM} Reduction Methods and New Defect Oriented Test Methods Applied to Advanced FinFET Technologies}, booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA, October 29 - Nov. 1, 2018}, pages = {1--10}, publisher = {{IEEE}}, year = {2018}, url = {https://doi.org/10.1109/TEST.2018.8624906}, doi = {10.1109/TEST.2018.8624906}, timestamp = {Mon, 01 Mar 2021 13:46:57 +0100}, biburl = {https://dblp.org/rec/conf/itc/HowellHBVDGRSFR18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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