BibTeX record conf/itc/HapkeRSKGWHE10

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@inproceedings{DBLP:conf/itc/HapkeRSKGWHE10,
  author    = {Friedrich Hapke and
               Wilfried Redemund and
               J{\"{u}}rgen Schl{\"{o}}ffel and
               Rene Krenz{-}Baath and
               Andreas Glowatz and
               Michael Wittke and
               Hamidreza Hashempour and
               Stefan Eichenberger},
  editor    = {Ron Press and
               Erik H. Volkerink},
  title     = {Defect-oriented cell-internal testing},
  booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
               USA, November 2-4, 2010},
  pages     = {285--294},
  publisher = {{IEEE} Computer Society},
  year      = {2010},
  url       = {https://doi.org/10.1109/TEST.2010.5699229},
  doi       = {10.1109/TEST.2010.5699229},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/conf/itc/HapkeRSKGWHE10.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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