BibTeX record conf/itc/HapkeKGSHEHA09

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@inproceedings{DBLP:conf/itc/HapkeKGSHEHA09,
  author    = {Friedrich Hapke and
               Rene Krenz{-}Baath and
               Andreas Glowatz and
               J{\"{u}}rgen Schl{\"{o}}ffel and
               Hamidreza Hashempour and
               Stefan Eichenberger and
               Camelia Hora and
               Dan Adolfsson},
  editor    = {Gordon W. Roberts and
               Bill Eklow},
  title     = {Defect-oriented cell-aware {ATPG} and fault simulation for industrial
               cell libraries and designs},
  booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
               USA, November 1-6, 2009},
  pages     = {1--10},
  publisher = {{IEEE} Computer Society},
  year      = {2009},
  url       = {https://doi.org/10.1109/TEST.2009.5355741},
  doi       = {10.1109/TEST.2009.5355741},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/conf/itc/HapkeKGSHEHA09.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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