BibTeX record conf/itc/FrancoMCCWMSF96

• > Home > conf/itc/FrancoMCCWMSF96

@inproceedings{DBLP:conf/itc/FrancoMCCWMSF96,
  author       = {Piero Franco and
                  Siyad C. Ma and
                  Jonathan Chang and
                  Yi{-}Chin Chu and
                  Sanjay Wattal and
                  Edward J. McCluskey and
                  Robert L. Stokes and
                  William D. Farwell},
  title        = {Analysis and Detection of Timing Failures in an Experimental Test
                  Chip},
  booktitle    = {Proceedings {IEEE} International Test Conference 1996, Test and Design
                  Validity, Washington, DC, USA, October 20-25, 1996},
  pages        = {691--700},
  publisher    = {{IEEE} Computer Society},
  year         = {1996},
  url          = {https://doi.org/10.1109/TEST.1996.557127},
  doi          = {10.1109/TEST.1996.557127},
  timestamp    = {Thu, 23 Mar 2023 23:58:41 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/FrancoMCCWMSF96.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}