BibTeX record conf/itc/DoreyJRRX88

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@inproceedings{DBLP:conf/itc/DoreyJRRX88,
  author       = {A. P. Dorey and
                  B. K. Jones and
                  Andrew Mark David Richardson and
                  P. C. Russell and
                  Y. Z. Xu},
  title        = {Reliability Testing by Precise Electrical Measurement},
  booktitle    = {Proceedings International Test Conference 1988, Washington, D.C.,
                  USA, September 1988},
  pages        = {369--373},
  publisher    = {{IEEE} Computer Society},
  year         = {1988},
  url          = {https://doi.org/10.1109/TEST.1988.207823},
  doi          = {10.1109/TEST.1988.207823},
  timestamp    = {Tue, 28 Apr 2020 16:20:00 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/DoreyJRRX88.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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