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BibTeX record conf/itc/ChengL95
@inproceedings{DBLP:conf/itc/ChengL95, author = {Kwang{-}Ting Cheng and Chih{-}Jen Lin}, title = {Timing-Driven Test Point Insertion for Full-Scan and Partial-Scan {BIST}}, booktitle = {Proceedings {IEEE} International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995}, pages = {506--514}, publisher = {{IEEE} Computer Society}, year = {1995}, url = {https://doi.org/10.1109/TEST.1995.529878}, doi = {10.1109/TEST.1995.529878}, timestamp = {Thu, 23 Mar 2023 23:58:42 +0100}, biburl = {https://dblp.org/rec/conf/itc/ChengL95.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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