BibTeX record conf/itc/ChenA91

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@inproceedings{DBLP:conf/itc/ChenA91,
  author       = {Chun{-}Hung Chen and
                  Jacob A. Abraham},
  title        = {High Quality Tests for Switch-Level Circuits Using Current and Logic
                  Test Generation Algorithms},
  booktitle    = {Proceedings {IEEE} International Test Conference 1991, Test: Faster,
                  Better, Sooner, Nashville, TN, USA, October 26-30, 1991},
  pages        = {615--622},
  publisher    = {{IEEE} Computer Society},
  year         = {1991},
  url          = {https://doi.org/10.1109/TEST.1991.519725},
  doi          = {10.1109/TEST.1991.519725},
  timestamp    = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/ChenA91.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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