BibTeX record conf/itc/ChakravadhanulaCPGKMN13

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@inproceedings{DBLP:conf/itc/ChakravadhanulaCPGKMN13,
  author       = {Krishna Chakravadhanula and
                  Vivek Chickermane and
                  Don Pearl and
                  Akhil Garg and
                  R. Khurana and
                  Subhasish Mukherjee and
                  P. Nagaraj},
  title        = {SmartScan - Hierarchical test compression for pin-limited low power
                  designs},
  booktitle    = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
                  USA, September 6-13, 2013},
  pages        = {1--9},
  publisher    = {{IEEE} Computer Society},
  year         = {2013},
  url          = {https://doi.org/10.1109/TEST.2013.6651897},
  doi          = {10.1109/TEST.2013.6651897},
  timestamp    = {Thu, 23 Mar 2023 23:58:42 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/ChakravadhanulaCPGKMN13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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