BibTeX record conf/itc/BlantonNL15

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@inproceedings{DBLP:conf/itc/BlantonNL15,
  author       = {R. D. (Shawn) Blanton and
                  Benjamin Niewenhuis and
                  Zeye (Dexter) Liu},
  title        = {Design reflection for optimal test-chip implementation},
  booktitle    = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
                  USA, October 6-8, 2015},
  pages        = {1--10},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/TEST.2015.7342379},
  doi          = {10.1109/TEST.2015.7342379},
  timestamp    = {Mon, 24 Feb 2020 17:28:37 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/BlantonNL15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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