BibTeX record conf/itc-asia/HuHLCW18

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@inproceedings{DBLP:conf/itc-asia/HuHLCW18,
  author       = {Jia{-}Yun Hu and
                  Kuan{-}Wei Hou and
                  Chih{-}Yen Lo and
                  Yung{-}Fa Chou and
                  Cheng{-}Wen Wu},
  title        = {RRAM-Based Neuromorphic Hardware Reliability Improvement by Self-Healing
                  and Error Correction},
  booktitle    = {{IEEE} International Test Conference in Asia, ITC-Asia 2018, Harbin,
                  China, August 15-17, 2018},
  pages        = {19--24},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/ITC-Asia.2018.00014},
  doi          = {10.1109/ITC-ASIA.2018.00014},
  timestamp    = {Sat, 30 Sep 2023 09:50:57 +0200},
  biburl       = {https://dblp.org/rec/conf/itc-asia/HuHLCW18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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