BibTeX record conf/isvlsi/SureshVK11

download as .bib file

@inproceedings{DBLP:conf/isvlsi/SureshVK11,
  author    = {Vikram B. Suresh and
               Priyamvada Vijayakumar and
               Sandip Kundu},
  title     = {On Screening Reliability Using Lithographic Process Corner Information
               Gleaned from Tester Measurements},
  booktitle = {{IEEE} Computer Society Annual Symposium on VLSI, {ISVLSI} 2011, 4-6
               July 2011, Chennai, India},
  pages     = {248--253},
  publisher = {{IEEE} Computer Society},
  year      = {2011},
  url       = {https://doi.org/10.1109/ISVLSI.2011.66},
  doi       = {10.1109/ISVLSI.2011.66},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/conf/isvlsi/SureshVK11.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
a service of Schloss Dagstuhl - Leibniz Center for Informatics