BibTeX record conf/issre/MaityN05

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@inproceedings{DBLP:conf/issre/MaityN05,
  author    = {Soumen Maity and
               Amiya Nayak},
  title     = {Improved Test Generation Algorithms for Pair-Wise Testing},
  booktitle = {16th International Symposium on Software Reliability Engineering {(ISSRE}
               2005), 8-11 November 2005, Chicago, IL, {USA}},
  pages     = {235--244},
  year      = {2005},
  crossref  = {DBLP:conf/issre/2005},
  url       = {https://doi.org/10.1109/ISSRE.2005.23},
  doi       = {10.1109/ISSRE.2005.23},
  timestamp = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/issre/MaityN05},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/issre/2005,
  title     = {16th International Symposium on Software Reliability Engineering {(ISSRE}
               2005), 8-11 November 2005, Chicago, IL, {USA}},
  publisher = {{IEEE} Computer Society},
  year      = {2005},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/10370/proceeding},
  isbn      = {0-7695-2482-6},
  timestamp = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/issre/2005},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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