Stop the war!
Остановите войну!
for scientists:
default search action
BibTeX record conf/isscc/SongKRKPPHYDLLK17
@inproceedings{DBLP:conf/isscc/SongKRKPPHYDLLK17, author = {Taejoong Song and Hoonki Kim and Woojin Rim and Yongho Kim and Sunghyun Park and Changnam Park and Minsun Hong and Giyong Yang and Jeongho Do and Jinyoung Lim and Seungyoung Lee and Ingyum Kim and Sanghoon Baek and Jonghoon Jung and Daewon Ha and Hyungsoon Jang and Taejung Lee and Chul{-}Hong Park and Bongjae Kwon and Hyuntaek Jung and Sungwee Cho and Yongjae Choo and Jaeseung Choi}, title = {12.2 {A} 7nm FinFET {SRAM} macro using {EUV} lithography for peripheral repair analysis}, booktitle = {2017 {IEEE} International Solid-State Circuits Conference, {ISSCC} 2017, San Francisco, CA, USA, February 5-9, 2017}, pages = {208--209}, publisher = {{IEEE}}, year = {2017}, url = {https://doi.org/10.1109/ISSCC.2017.7870334}, doi = {10.1109/ISSCC.2017.7870334}, timestamp = {Fri, 14 Aug 2020 10:25:28 +0200}, biburl = {https://dblp.org/rec/conf/isscc/SongKRKPPHYDLLK17.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.