BibTeX record conf/isscc/SaneyoshiNM10

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@inproceedings{DBLP:conf/isscc/SaneyoshiNM10,
  author       = {Eisuke Saneyoshi and
                  Koichi Nose and
                  Masayuki Mizuno},
  title        = {A precise-tracking NBTI-degradation monitor independent of {NBTI}
                  recovery effect},
  booktitle    = {{IEEE} International Solid-State Circuits Conference, {ISSCC} 2010,
                  Digest of Technical Papers, San Francisco, CA, USA, 7-11 February,
                  2010},
  pages        = {192--193},
  publisher    = {{IEEE}},
  year         = {2010},
  url          = {https://doi.org/10.1109/ISSCC.2010.5433994},
  doi          = {10.1109/ISSCC.2010.5433994},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/isscc/SaneyoshiNM10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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