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BibTeX record conf/isscc/KulkarniTANATD15
@inproceedings{DBLP:conf/isscc/KulkarniTANATD15, author = {Jaydeep P. Kulkarni and Carlos Tokunaga and Paolo A. Aseron and Trang Nguyen and Charles Augustine and James W. Tschanz and Vivek De}, title = {4.7 {A} 409GOPS/W adaptive and resilient domino register file in 22nm tri-gate {CMOS} featuring in-situ timing margin and error detection for tolerance to within-die variation, voltage droop, temperature and aging}, booktitle = {2015 {IEEE} International Solid-State Circuits Conference, {ISSCC} 2015, Digest of Technical Papers, San Francisco, CA, USA, February 22-26, 2015}, pages = {1--3}, publisher = {{IEEE}}, year = {2015}, url = {https://doi.org/10.1109/ISSCC.2015.7062936}, doi = {10.1109/ISSCC.2015.7062936}, timestamp = {Wed, 15 Jul 2020 09:05:21 +0200}, biburl = {https://dblp.org/rec/conf/isscc/KulkarniTANATD15.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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