BibTeX record conf/isqed/YokoyamaIKMTASTFNY14

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@inproceedings{DBLP:conf/isqed/YokoyamaIKMTASTFNY14,
  author       = {Yoshisato Yokoyama and
                  Yuichiro Ishii and
                  Hidemitsu Kojima and
                  Atsushi Miyanishi and
                  Yoshiki Tsujihashi and
                  Shinobu Asayama and
                  Kazutoshi Shiba and
                  Koji Tanaka and
                  Tatsuya Fukuda and
                  Koji Nii and
                  Kazumasa Yanagisawa},
  title        = {40nm Ultra-low leakage {SRAM} at 170 deg.C operation for embedded
                  flash {MCU}},
  booktitle    = {Fifteenth International Symposium on Quality Electronic Design, {ISQED}
                  2014, Santa Clara, CA, USA, March 3-5, 2014},
  pages        = {24--31},
  publisher    = {{IEEE}},
  year         = {2014},
  url          = {https://doi.org/10.1109/ISQED.2014.6783302},
  doi          = {10.1109/ISQED.2014.6783302},
  timestamp    = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl       = {https://dblp.org/rec/conf/isqed/YokoyamaIKMTASTFNY14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}