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BibTeX record conf/isqed/LiLYMCCZO01
@inproceedings{DBLP:conf/isqed/LiLYMCCZO01, author = {Wei Li and Qiang Li and J. S. Yuan and Joshua McConkey and Yuan Chen and Sundar Chetlur and Jonathan Zhou and A. S. Oates}, title = {Hot-carrier-Induced Circuit Degradation for 0.18 {\(\mathrm{\mu}\)}m {CMOS} Technology}, booktitle = {2nd International Symposium on Quality of Electronic Design {(ISQED} 2001), 26-28 March 2001, San Jose, CA, {USA}}, pages = {284--289}, publisher = {{IEEE} Computer Society}, year = {2001}, url = {https://doi.org/10.1109/ISQED.2001.915244}, doi = {10.1109/ISQED.2001.915244}, timestamp = {Thu, 23 Mar 2023 23:58:32 +0100}, biburl = {https://dblp.org/rec/conf/isqed/LiLYMCCZO01.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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